Introducing ZEISS Crossbeam 750 FIB-SEM
View Online We are pleased to unveil the newest addition to the ZEISS Microscopy portfolio: meet the ZEISS Crossbeam 750 FIB-SEM! With the Crossbeam 750, you can reduce rework and improve yield while delivering highly uniform TEM lamellae and precise FIB cross sections on the first pass. Live simultaneous SEM imaging during FIB milling has been extended down to 0.5 kV for ultrafine lamella polishing. This eliminates milling interruptions, delivering clarity and precision for advanced semiconductor and materials science analysis. Explore ZEISS Crossbeam 750 FIB-SEM Clarity with outstanding SEM quality. Crossbeam 750 FIB-SEM’s new high-dy...