Universo Eletrico (Eletric Universe)

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  00800 2255 4835 Date: May 2 nd , 2023 Time: 15:00 – 15:30 CET   As successive generations of PCI Express (PCIe) continue to double the data rates roughly every 3 years, the time and complexity of testing has risen exponentially. And while test equipment like oscilloscopes and bit error rate testers (BERTs) have met the bandwidth requirements for this testing, less focus has been on improving test times and reducing test complexity as these data rates rise. Meet Michael Seaholm, Product Manager for Performance Oscilloscopes and Margin Testing at Tektronix Inc. at Semisrael webinar and ask your questions! Register Now > The Capitol Building, Oldbury Bracknell, Berkshire, RG12 8FZ, UK ©2023 Tektronix, Inc. All rights reserved.

            Microcontroller and Microprocessor news April 2023     Click here to stay up to date with our other industry sector newsletters!     NEW PROBE STLINK-V3PWR energy profiler for STM32 MCUs New STLINK probe lets you debug code and measure energy consumption with high accuracy. Read more   NEW MCU SERIES High performance STM32H5 MCUs Most powerful MCU with Arm Cortex-M33 at 250 MHz brings performance and scalable security for nex...