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Test & Measurement News
// March 2017
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From the early stages of design to the
point when it’s ready for market, a new power device undergoes a gamut of
test and characterization activities, and you face many steps in bringing
that device to market.
Download
our free Tektronix Guide and learn how to overcome challenges
posed by each stage of the power semi device life cycle.
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Faster Insight for Your Bold Discoveries
- The 4200A
The 4200A-SCS is a modular, customizable, and fully-integrated parameter
analyzer that provides synchronized insight into current-voltage (I-V),
capacitance-voltage (C-V), and ultra-fast pulsed I-V electrical
characterization.
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Watch our Live Webinar: Tips and Techniques to Simplify
MOSFET/MOSCAP Device Characterization
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This webinar presents a new technique that
makes characterization
and parameter extraction easier and quicker. We'll
discuss parameter extraction and which tests will give you the most information about your
device.
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Register
and learn how to:
- Characterize both AC and DC properties of a MOS device
- Perform I-V and C-V measurements correctly the first
time
- Switch between DC and AC measurements quickly and
easily
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Can't make the date but don't want to miss out? No problem, simply register for the webinar
and we'll send you
a link to the recording after the event.
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Improve your
Design and Manufacturing with Advanced SMU Capabilities
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Learn how to improve your processes
within your business.
Watch us
demonstrate the digitizing capabilities of the Keithley 2461 Sourcemeter
using a high brightness LED.
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Want to browse the full Keithley and
Tektronix product range?
Request a
catalogue to look at all of our products, wherever you are, whenever you
need to.
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Best regards,
Peter Bachmayr
Keithley
Instruments
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® 2017 Tektronix | One Thames Valley,
Wokingham Rd, Bracknell, Berkshire, RG42 1NG, UK
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