NEW Live Webinar: Mastering Defect Localization with Passive Voltage Control

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Register
Can’t attend the live webinar?  Register and we will send you a link to watch the recording at your convenience.
Overview:

Failure analysis plays a pivotal role in the semiconductor industry, ensuring the quality, reliability, and performance of devices — factors that are essential in a field defined by high precision and large-scale production. Defect localization is a critical step in semiconductor failure analysis, enabling the identification of faults within complex integrated circuits and driving yield improvements in manufacturing processes.

In this first session of the ZEISS Microscopy Defect Localization Webinar Series, we spotlight passive voltage contrast (PVC) techniques using ZEISS GeminiSEM. Attendees will explore three key mechanisms for generating PVC in devices, supported by practical examples in both electron and ion microscopy. Join us to gain valuable insights into advanced approaches for defect localization.

Participants will:

  • Learn why defect localization is vital for semiconductor failure analysis.
  • Explore three PVC mechanisms: capacitance, grounding, and the built-in potential of a p/n junction.
  • Consider how the ability to select different energy distributions in ZEISS GeminiSEM enables accurate PVC.
  • Get practical tips to optimize PVC techniques and your analysis results.
 
Presented by: 
Greg Johnson
Senior Application Development Engineer
 

Greg Johnson is a Senior Application Development Engineer in the Electronics Sector of ZEISS Microscopy and a senior member of lEEE. With over two decades of experience in semiconductor process development and failure analysis, Greg brings a wealth of experience to his role.

Before joining ZEISS, Greg spent a significant portion of his career at IBM East Fishkill, where he contributed to process development of ceramic packaging during his first ten years. Later, at IBM’s Semiconductor Research and Development Center, he led efforts in FEOL defect localization across seven technology node qualifications. In this role, Greg developed new failure analysis techniques for addressing complex yield problems in semiconductor manufacturing.

At ZEISS, Greg collaborates with failure analysis engineers in industry across three continents to further advance the use of SEM, FIB-SEM, and AFM techniques for semiconductor process development.



 
Dr. Sven Davani
Market Sector Manager
 

Dr. Sven Davani is Market Sector Manager for Electronics at ZEISS where he focuses on leveraging electron microscopy capabilities in SEM and FIB-SEM technologies to address challenges in advanced semiconductor logic, memory, and packaging. With a strong background in research and innovation, Sven brings a customer-centric approach to driving technology adoption in the electronics industry.

Before joining ZEISS, Sven worked in R&D consulting, advising on innovation strategies for cutting-edge technologies. He also led product management in a startup environment, where he gained hand-on experience in bringing new technologies to market.

Sven holds a PhD in Physics from the University of Münster, where his research focused on material science and microscopy. His work has been published in leading journals, including Acta Materialia, Ultramicroscopy, and Scripta Materialia, reflecting his expertise in the field. This research foundation informs his ability to bridge the gap between advanced technology and practical customer need.


 
Register

 
Sponsored by:
About our sponsor:
 

ZEISS has the most comprehensive portfolio of light, X-ray, electron beam and ion beam imaging technologies in the industry and is a leading solution provider to the global semiconductor community. Solutions span semiconductor manufacturing from wafer fab through packaging and assembly. ZEISS materials characterization and non-destructive failure analysis solutions deliver actionable information to both wafer fab and packaging/assembly processes to meet the semiconductor industry’s challenges for next-generation devices.

Contact information: Email: microscopy@zeiss.com

 
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58 Summer Street
Andover, MA  01810

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