Join us next week — Advanced XRF Coatings Analysis Equipment for Semiconductor Components

Register Can’t attend the live webinar?  Register and we will send you a link to watch the recording at your convenience. Overview: XRF analysis is a widely used technique to measure plating thickness. Its main advantage resides in allowing simultaneous non-destructive analysis of multilayered plating samples. The miniaturization and increasing complexity of electronic devices proliferated by advancements in smartphone functionality continues with the rise of AI hardware components including GPUs, TPUs, and ASICs, as well as advanced driver-assistance systems (ADAS), and microelectromechanical systems (MEMS). Consequently, the electronic components and features for these devices are becoming as minuscule as ever. To maintain the necessary quality of these components, the measuring and control of the plating thickness and composition is crucial.  For this application, an XRF plating thickness analyzer capable of high accuracy measurement in small areas is essential.   Utilizing the latest X-ray focusing polycapillary technology with a high-sensitivity detector, the XRF systems offered by Hitachi High-Tech deliver high-precision measurements of nanometer-scale plating. The beam diameter of less than 20 µm (FWHM) not only allows plating thickness measurements but also composition analysis, useful for solder bumps. This allows for an outstanding measurement repeatability, achieving precision of 1% RSD for gold plated at 100Å.    Whether measuring microscopic plated areas or analyzing the composition of solder bumps, the Hitachi High-Tech energy dispersive X-ray fluorescence coatings analysis systems are straightforward, effective solutions for quality assurance and quality control. What you'll learn: How XRF works What kinds of measurements are feasible Where XRF can be used in the semiconductor industry How advanced hardware and software can make you more productive   Presented by:  Mr. Marty Schreck Hitachi High-Tech America Marty Schreck is Hitachi High-Tech Americas’ product specialist for their line of XRF coatings and materials analyzers.  In his role, he works with customers across numerous industries to find new solutions to the challenges they face in their everyday work environment for production control, QC/QA, engineering design, and failure analysis.  He has 40 years of experience working with XRF technology, holding many roles along the way.

Register Sponsored by: Hitachi High-Tech America provides a comprehensive suite of advanced analytical instruments -from XRF to Optical Emission Spectroscopy (OES) - designed for high precision and dependable performance in quality control, and industrial environments. Our technologies support critical work across industries. Backed by a knowledgeable and responsive support team, we go beyond delivering instruments - we partner with our customers through expert training, application consulting, and dedicated after-sales service to ensure long-term success and optimal system performance. Measure with Confidence. Hitachi High-Tech America, Inc. 2 Technology Park Drive 2nd Floor Westford, MA 01886 1-888-580-8070 contact@hitachi-hightech.com  https://www.hitachi-hightech.com/us/en/

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