Postagens

Mostrando postagens de dezembro, 2016

Developer, we miss you!

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Developer, we miss you! Please visit our blog and learn more on embedded development in general, and Cortex-M development using Atollic TrueSTUDIO in particular.  Click here to visit the blog :   If you have any questions on upgrading to TrueSTUDIO PRO, check out our Upgrade to Pro FAQ page , or contact us at sales@atollic.com or sales.us@atollic.com .  Sincerely, The TrueSTUDIO product team       Atollic AB   Science Park  Gjuterigatan 7  Jönköping,  SE   553 18   Sweden

2016 Recap: Internet security trends and developments

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2016 Recap: Internet security trends and developments Ransomware, ransomware, ransom everywhere. 2016 was the year ransomware hit epidemic levels and has kept everyone at Emsisoft, from our lab to security writers, incredibly busy. New strains are popping up almost weekly! We are advancing our vision for a malware-free world with more decrypter tools, joining a global initiative to fight ransomware cybercrime and still managing to launch eagerly anticipated product releases across our award-winning portfolio. It's been an action-packed 2016 for us here at Emsisoft. Read what's ahead for 2017!

Innovate Better and Faster with the TBS2000 Scope

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00800 2255 4835 More Scopes. More Reliability. More Functionality The new TBS2000, an affordable scope that delivers class-leading performance and offers more advanced features than you’d expect from a basic oscilloscope. Check out how the performance and key features can help you do more and innovate faster! FIND OUT MORE   〉 Best regards, Your Tektronix Team - EMEA ® 2016 Tektronix | One Thames Valley, Wokingham Rd, Brackne

IBGE lança Mapa de Cobertura e Uso da Terra | GEOeduc prorroga Promoção de Natal | Governo determina R$ 1 bilhão de investimento em obras hídricas

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GEOeduc prorroga Promoção de Natal: cursos até 50% OFF e bônus de R$ 600! Governo federal determina investimento de R$ 1 bilhão em obras hídricas IBGE lança novo Mapa de Cobertura e Uso da Terra do Brasil Vídeo: palestra sobre novidades do Decea para autorização de voos com Drones Assista esse replay, conheça e tire-dúvidas sobre as novidades previstas na atualização da ICA 100/40. Confira também ... Livro mostra como usar Sensoriamento Remoto no apoio a casos de Desastres Repleto de exemplos reais, gráficos explicativos e dados atualizados, o livro não apenas é indicado para ... Ferramenta de modelagem ambiental do Inpe ganha nova versão Software livre LuccME auxilia usuários na tomada de decisão em questões de planejamento territorial e ambiental.

Live Webcast: GaN for Military Radar and Electronic Warfare Systems

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LIVE EVENT: GaN for Military Radar and Electronic Warfare Systems February 9, 2017 11:00 AM EST Sponsored by: REGISTER NOW Military radar and electronic warfare (EW) system designers are leveraging Gallium Nitride (GaN) technology more and more for their RF solutions as the price for GaN devices drops and as the industry learns more about GaN's performance benefits. GaN enables power density and higher efficiencies not possible before in active electronically scanned array (AESA) radar systems, which in turn enables more multifunctional and adaptive radar and EW systems. This E-cast of industry experts will discuss the performance and power benefits of GaN RF solutions, the technology's support for broadband, determining where GaN fits and doesn't fit in military RF systems, power components and more. Sponsors: Evans Capacitor, Mercury Systems Mod

The Key to Power Semiconductor Test

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0800 2255 4835  Get the Resolution You Need for Power Semiconductor Test Do you need to characterise or test power semiconductors, HBLEDs, optical devices, solar cells, and GaN, SiC and other compound materials and devices? if so you should consider using either a  Keithley 2651A or 2657A Source Measure Unit (SMU) instrument . Both instruments: Offer great versatility by combining a precision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic load and trigger controller Dramatically improve test time by allowing a user to execute test programs within the instrument Make safe and easy connections when testing devices at either the packaged part or wafe