Test and Measurement News - Keithley Edition - March 2017

Tektronix
Test & Measurement News
// March 2017
Power Up with Keithley!

From the early stages of design to the point when it’s ready for market, a new power device undergoes a gamut of test and characterization activities, and you face many steps in bringing that device to market.

Download our free Tektronix Guide and learn how to overcome challenges posed by each stage of the power semi device life cycle.


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Faster Insight for Your Bold Discoveries - The 4200A

The 4200A-SCS is a modular, customizable, and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V electrical characterization.


Watch our Live Webinar: Tips and Techniques to Simplify MOSFET/MOSCAP Device Characterization

This webinar presents a new technique that makes characterization and parameter extraction easier and quicker. We'll discuss parameter extraction and which tests will give you the most information about your device.
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Register and learn how to:
  • Characterize both AC and DC properties of a MOS device
  • Perform I-V and C-V measurements correctly the first time
  • Switch between DC and AC measurements quickly and easily

Can't make the date but don't want to miss out? No problem, simply register for the webinar and we'll send you a link to the recording after the event.


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Improve your Design and Manufacturing with Advanced SMU Capabilities
Learn how to improve your processes within your business.

Watch us demonstrate the digitizing capabilities of the Keithley 2461 Sourcemeter using a high brightness LED.


Want to browse the full Keithley and Tektronix product range?

Request a catalogue to look at all of our products, wherever you are, whenever you need to.
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Best regards,

Peter Bachmayr
Keithley Instruments

® 2017 Tektronix | One Thames Valley,
Wokingham Rd, Bracknell, Berkshire, RG42 1NG, UK

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