Understanding functional safety FIT base failure rate estimates
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Functional safety standards such as IEC 61508 and ISO 26262
require semiconductor device manufacturers to address both systematic
and random hardware failures.
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Base failure rates (BFR) quantify the intrinsic reliability of
the semiconductor component while operating under normal environmental
conditions. BFR is typically multiplied by factors such as temperature,
voltage and number of operating hours to arrive at a quantitative
measure of the quality of the component. The BFR can be estimated by a
variety of techniques.
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Our new white paper
focuses on two widely accepted techniques to estimate the BFR for
semiconductor components; estimates per IEC Technical Report 62380 and
SN 29500 respectively.
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